Fri, 23 October, 2020
Details of an aspect of a TWI project have been published as a perspective in the Journal of Physics: Photonics.
The paper, titled ‘Scatterometry and Diffractometry Techniques to Monitor Surfaces Textured by Rapid Ultra-Short Pulse Laser,’ details an investigation into a promising method to characterise microstructured surfaces employing scatterometry and diffractometry techniques and their possible implementation in an inline process monitoring system.
The paper comes as a result of the PROMETHEUS Project, within which TWI Ltd is a contributing partner. The project aims to create a laser texturing system which can create micro and nano-textured surfaces at high speeds using direct laser interference patterning (DLIP) technology. The end goal is to implement the system for industrially compatible applications.
The final aim of the scatterometry and diffractometry research is to validate the DLIP process. This will allow for the creation of a scalable prototype to generate and validate hydrophobic/oleophobic and hydrophilic/oleophilic structures in a way that is relevant for industry.
You can see the report of this EU Horizon 2020 project here.