Resolving TOFD Depth Errors by Parallel Scans

TOFD depth error caused by lateral uncertainty of defect location and features of parallel scan to resolve this error.

Join us for an insightful technical webinar focused on a critical challenge in ultrasonic testing — depth errors in Time of Flight Diffraction (TOFD) due to lateral uncertainty in defect location. This session will explore both the theoretical and practical aspects of TOFD, as well as the role of parallel scan techniques in minimizing such errors.

Highlights:

• Fundamentals of TOFD: Wave nature and general setup
• Common TOFD errors and understanding dead zones
• Overview of scan types for various applications
• Deep dive into parallel scan: data acquisition, analysis, and a balanced view of its pros and cons

What to Expect:

Participants will gain a strong foundation in TOFD basics, equipment setup, and industrial requirements for different scanning mechanisms. The session will provide detailed insights into how parallel scanning can effectively reduce depth sizing errors caused by lateral defect uncertainties — an essential topic for professionals aiming to improve inspection accuracy and reliability.

Speakers

Sathish Murugan

Mr Sathish Murugan Holds M.Tech Degree in NDT From the National Institute of Technology. He has extensive knowledge in advanced NDE Technologies like Phased Array Ultrasonic, Automated ultrasonic testing-Pipeline, Time of Flight Diffraction, Eddy Current Testing and Tube Inspection Techniques. He has been actively involved in the application of various conventional and advanced NDT techniques for inspection at pre-service & in-service stages in Refineries, Power Plants, Chemical & fertilizer industries etc. He has vast experience in offshore/onshore pipeline AUT projects at various levels.